Yes.
The red layer is a mix of several or many different chemical compounds, so depending on which spot you look at, you might see more or less, or nothing at all, of any element.
In particular, all sides agree that the red layers are composed of an organic matrix in which are embedded smaller particles of specific materials, and the whole quest here is to figure out the chemical nature of these particles:
- All agree that there are particles of Fe2O3 - we see them as "grains" ca. 100-150 nm small in Fig 8.
- We claim that chips a-d also contain particles of Kaolin, which has the chemical formula Al2Si2O5H9 (and may have some natural contamination with Ti, Ca, K and other common metals) - we see them as these platelet in Fig. 8. Harrit e.al. claim on the other hand that these platelets may somehow be a composite of elemental Al and some unexplained Si and O content. XEDS cannot prove that either way, as XEDS only sees the atoms as such, but not their chemical bindings.
- Ivan and I claim that there must be particles (pigments, probably needle-shaped) of strontium chromate in chips a-d, as we believe these are LaClede paint
- Sunstealer and I claim that the MEK-chip, since we believe it is Tnemec, would contain particles of silica (SiO2), pigments of zinc chromate, and others.
Whatever materials are in the focus of the beam, that's what you're going to measure. So if manage you focus on nothing but a bit of the diatomaceous silica that is contained on Tnemec and thus, I believe, in the MEK-chip, you would measure only Si and O (plus some C, as you can't totally avoid hitting some of the surrounding organic matrix; plus tiny fractions of natural contamination, since diatomaceous silica is a mined product from natural geological deposits) - Fig 16 could be an example of that, it has high peaks of Si and O, tiny ones of C and Fe, and nothing else.
If you focus elsewhere, on the iron oxide grains for example, you might get the high Fe and O that is characteristic of that compound.
It would, however,
not be possible to focus such that you "miss" one of the elements in a compound, because the molecules we are talking about here are much much smaller than eben the highest resolution of the electron beam could differentiate (at least in SEM-modus). If all your aluminium is bound to, say, silicate, it would
not be possible to get an XEDS chart that shows lots of Al but very little Si or O. If all your aluminium is bound as aluminium oxide, it would
not be possible to get a chart with high Al but too little O.
And therein lies the significance of Fig 17: It seems that this chart has captured more Al, quantitatively in terms of number of atoms, than could be chemically coupled with the little O, Fe, Si, Mg, C that's also measured, and that would indeed imply that at least some of the Al is not chemically bound, i.e.
is elemental.
Now a couple of words of caution: XEDS has a lot of inherent difficulties, owing to the somewhat complicated physical interactions of x-rays with different materials, and other reasons. Because of this,
- any quantification of the elemental composition from an XEDS measurement comes with degrees of uncertainty, stemming from absorption, reflection and other optical phenomena that depend on the geometry and chemistry of the specimen, and properties of the machine.
- the lightest few elements of the periodic table can't be detected at all (most significantly hydrogen)
- some elements are easy to miss because their main signals would be beyond the range of energies that the chart plots (notice: in most charts, the x-axis ends at 10 keV, and none show anything but noise beyond 9 keV), and their lesser signals may be too weak to rise above noise. Lead might be a candidate for this in the context of paints.
- some elements could be missed due to their small signal being too close to the larger signal of another element - the most important candidate in our discussion being strontium, which is prone to "hide" under the Si-signal
- and of course the experimenter could mishandle the machinery or the specimen and screw things up beyond repair
In fact, I suspect that Fig. 17 is the result of improper handling. The pedestal on which the specimen is mounted in the SEM-XEDS machine tyically is made of aluminium, and I suspect that somehow Jones picked up Al-signal from the pedestal when he focused on the very edge of the chip. Remember, Fig 15a shows Al peculiarly concentrated on that edge, and even shows lots of Al outside of the chip! Alternatively, the fact that these egdes are far from being oriented perpendicularly to the line of sight of the instrument is a problem - this geometric property influences the measurement in difficult to gauge degrees. Ideally, the surface that you scan ought to be flat, smooth and perpendicular to your electron beam or x-ray-detector's line of sight. None of this is the case here.
I have been following this thread with interest I hope the notes are of some help.
Some published papers do not go far enough when describing the particular SEM analyzer combination, and working conditions. This can be important when viewing the results.
A few points about the use of the SEM EDX/WDX combination.
When analyzing any sample, you really need to know your sample before you start.
Henno J. Nairis Swedish Geological Survey. A good friend.
The SEM conditions, and geometry for analyzing/imaging a given sample are important to obtain good results.
The systems generally used are, EDX, Energy dispersive X-ray (Analysis) which uses
a semiconductor material as the detector, and as the name implies, detects the X-ray energy from the sample. WDX, Wavelength Dispersive X-ray (analysis) uses a crystal and a gas filled “counter” to detect the X-ray wavelength. There are pros and cons associated with each. EDX gives a “quick” semi- quantitative analysis of all the elements in the sample, (within the detector range) (or windowless), but generally will not detect elements below Sodium, and if the concentration is less than about 0.5-1 percent. Modern EDX systems reveal excellent resolution of 150 eV and better, however getting these results depends more on the nature of the sample, and the EDX beam/chamber geometry than the quality of the detector. The WDX is slower, it only detects elements one, at a time, is more complex mechanically, and much more expensive, however the resolution is much better, typically 20 eV and can detect all elements. A combination of the two is better, but can introduce other problems.
Non conducting samples can be mounted on a carbon sample holder, and covered with a thin layer of sputtered carbon, this helps to prevent the sample “charging, this “charging” can deflect the electron beam from the point on the sample being analyzed, ideally the sample should be “potted” in a suitable resin and polished, if possible. A set of standard elements for calibration should be included, these are mounted close to the sample in the SEM sample chamber, and used to compare the count rate from a known pure element, with the sample under analysis. A sample current amplifier can be installed between the sample an earth, to monitor the current in the sample. The detector angle should be as high as possible to avoid absorption of the emitted X-rays by surface inconsistencies, i.e. lumps bumps, and holes, as pointed out by Oystein. Further, modern scintillator BSD backscatter detectors can be connected to suitable electronics
to give an approximate comparison between element number, and sample contrast, albeit with reservations. Secondary emission is not unknown and can arise where fasteners, or screws are in close proximity to the beam/raster, coating these areas with a colloidal graphite solution can help,
although advise should be sought before doing this.
The SEM beam diameter, or spot size. should be as small as possible, but still have enough current density to produce sufficient quantities of X-rays. Standard tungsten filaments do this well. If Al is present, where they should be non, or little, the analysis may have been performed in the scanning mode, thus exiting elements outside of the area. Ideally analysis should be performed with the raster switched off, or the magnification increased so none of the raster is outside of the area to be analyzed, but there are reservations. It may also be that the exited volume is large, even in spot mode and overlaps other elements close by, or even beneath the area of interest. Dangers everywhere.
A description of the operating conditions of the SEM and information on how the sample has been prepared, and SEM geometry would go a long way to avoid misunderstanding the results. In a word sample preparation is half the battle.
These few notes are not intended as a critique of articles in this thread, rather to complement some of the points already mentioned by Oystein, and pitfalls which can be avoided with adequate sample preparation, and optimization of the SEM.
There are few absolutes, rather, “horses for courses” the smart researcher should equip himself/herself with a competent SEM technician who is familiar with his SEM combination inside out.
So, if you have the cash, and the time, a dedicated WDX micro analyzer is essential, the more spectrometer the merrier, but with recourse to a EDX, especially if little is known about the sample.
The quality of the results obtained are not wholly, but by and large dependant the aforementioned criteria. One of the best Microanalysers ever was the Cambridge Scientific
Instruments GeoScan Mk. V.
References:
Notes on EDX
http://www.google.se/url?sa=t&rct=j...hHmSPVB8B7qZ3f1Mg&sig2=7nS5NAZnaMOW12RQVEolQQ
Standards for X-ray microanalysis
http://www.macstandards.co.uk/about.html
WDX microanalysis
http://www.google.se/url?sa=t&rct=j...f9Y0ljdhJHUuw0HkQ&sig2=NGQRXqjQITRo5s_OCZi6IA